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JAEA Reports

Development of a high brightness ion source for IFMIF and preliminary test results

Iga, Takashi*; Okumura, Yoshikazu; Kashiwagi, Mieko

JAERI-Tech 2001-028, 16 Pages, 2001/05

JAERI-Tech-2001-028.pdf:0.95MB

no abstracts in English

Journal Articles

Quasi-dc extraction of 70keV,5A ion beam

Okumura, Yoshihiro; Matsuda, Shinzaburo; Mizutani, Yasuhiko*; Ohara, Yoshihiro; Oga, Tokumichi

Review of Scientific Instruments, 51(6), p.728 - 734, 1980/06

https://doi.org/10.1063/1.1136303
 Times Cited Count：23 Percentile：90.66(Instruments & Instrumentation)

no abstracts in English

Journal Articles

Experimental study of ion beamlet steering by aperture displacement in two-stage accelerator

; Mizutani, Yasuhiko*; Ohara, Yoshihiro

Review of Scientific Instruments, 51(4), p.471 - 473, 1980/00

https://doi.org/10.1063/1.1136248
 Times Cited Count：21 Percentile：89.72(Instruments & Instrumentation)

no abstracts in English

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